Instrument power supply: 3.7V power supply or direct power supply with micro USB interface
â—†Using ATmega328 microcontroller.
â—† 12864 graphic LCD display test results.
â—† One-button operation, automatic power off.
â—† Exclusively add a power switch to avoid battery drain when storing and shutting down.
â—† Automatic detection of PNP and NPN bipolar transistors, N, P-channel MOSFETs, JFET FETs, diodes, dual diodes, thyristors, resistors, capacitors, inductors. The pin definition is automatically detected.
â—† Measure the current amplification factor (B) of the bipolar transistor and the turn-on voltage (Uf) of the emitter junction. Darlington transistors can be identified by high threshold voltages and high current amplification factors.
â—† The protection diode inside the bipolar transistor and MOSFET can be detected and displayed on the screen.
â—† Measure the threshold voltage and gate capacitance of the MOSFET.
â—† Supports the measurement of two resistors, and the potentiometer can also measure. If the potentiometer is adjusted to one end of it, the tester cannot distinguish between the middle and the ends.
â—† The resolution of the resistance measurement is 0.1 ohm and the measured value is 50M ohm.
â—† Capacitance measurement range from 25pf to 100mF (100, 000UF). The resolution is up to 1 pF, and the inductance measurement range is 0.01 MH-20H. Otherwise, it will be displayed as a resistor. If the DC resistance of the inductor is higher than 2100 ohms, it will also be displayed as a resistor.
â—† It can detect the equivalent series resistance (ESR) of capacitors above 2UF with a resolution of 0.01 ohms. This feature is very important for detecting capacitive performance.
â—† It is possible to display the sign of the correct direction for both diodes and display the forward voltage drop.
â—† The LED is detected as a diode, and the forward voltage drop is higher than the normal value. The dual LEDs are detected as dual diodes. At the same time, the LED will flash.
â—† Each test takes about two seconds, and only large capacitance and inductance measurements take a long time.
